Type : Bid Notification
BACKGROUNDThis project involves an existing NIST Synchrotron beamline at the National Synchrotron Light Source II (NSLS-II) and an existing CRADA with IBM. It’s purpose is to improve the X-ray Absorption Spectroscopy (XAS) measurement capabilities for state of the art semiconductor samples working directly with IBM researchers stationed at NIST’s Beamline for Materials Measurement (BMM) and other researchers studying materials for information technology. The proposed detector enhancement will substantially increase sample throughput and measurement sensitivity, driving the ability to probe semiconductor device interfaces, a broader set of element/matrix combinations, and nanoscale structures in device stacks. These enhanced capabilities wil...