Search results for: device milling focused ion

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  • Device Milling Focused Ion Beam (FIB)

    Type : Bid Notification

    Due : 11 Feb, 2023 (14 months ago)
    Posted : 15 months ago
    Started : 12 Jan, 2023 (15 months ago)

    The National Renewable Energy Laboratory (NREL) in Golden, CO seeks a readily available and demonstrable plasma focused ion beam, scanning electron microscope, and femtosecond laser where all three beams have coincident alignment on the sample for cross-sectioning devices at the millimeter length scale, 3D volume imaging, FIB polishing, and nanoscale imaging with 3D EDS and 3D EBSD mapping, as well as related accessories.

    From: Federal Government (Federal)

  • One (1) broad beam ion polisher

    Type : Bid Notification

    Due : 26 Apr, 2024 (Yesterday)
    Posted : 7 days ago
    Started : 19 Apr, 2024 (8 days ago)

    The Contractor shall provide one (1) broad beam ion polisher with the following specifications: 1) Argon gun(s) used as the ion source with mass flow controller. 2) Maximum ion beam energy of six (6) kilovolt (kV) or higher 3) Minimum ion beam energy of 100 volt (V) or less 4) Timed beam on/off intervals 5) Tabletop design 6) Turbo pump for vacuum system 7) Cross-section milling capability.

    From: Federal Government (Federal)

  • ION MILL FOR SEM SAMPLES

    Type : Contract

    Due : 28 Jul, 2023 (9 months ago)
    Posted : 14 months ago
    Started : 06 Feb, 2023 (14 months ago)

    ION MILL FOR SEM SAMPLES Solicitation ID/Procurement Identifier: 140G0123Q0062 Ultimate Completion Date: Fri Jul 28 17:00:00 GMT 2023

    From: Federal Procurement Data System (Federal)