Search results for: emission scanning

THIS IS NOT A REQUEST FOR PROPOSALS, AN INVITATION FOR BIDS, OR A REQUEST FOR QUOTATIONS. FURTHER, IT DOES NOT REPRESENT A COMMITMENT BY THE GOVERNMENT TO PAY FOR COSTS INCURRED IN PREPARATION AND SUBMISSION OF DATA OR ANY OTHER COSTS INCURRED IN RESPONSE TO THIS ANNOUNCEMENT.This is a Special Notice (PUR240058) with the intent to award a sole source purchase order to FEI Company (FEI), under the authority of FAR 13.106-1 based on their unique technical qualifications as the only known company authorized to provide a service agreement for one (1) Apreo S LoVac Field Emission - Scanning Electron Microscope (FESEM). The National Transportation Safety Board (NTSB) knows of no other sources for this requirement. Notice is provided...

NASA GLENN RESEARCH CENTER REQUIRES AN ANALYTICAL, HIGH RESOLUTION, THERMAL SCHOTTKY TYPE FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FE-SEM). Solicitation ID/Procurement Identifier: 80TECH24Q0005 Ultimate Completion Date: Fri Jul 26 17:00:00 GMT 2024

23-1878-RFQ - Supply of Electron Microscope: Field Emission Scanning Project Description :The University of Northern British Columbia seeks qualified vendor(s) for the supply and delivery of a Field Emission Scanning Electron Microscope for its Northern Analytical Laboratory Service (http://www.nalslab.ca) located on the University Prince George campus which provides service to the

Sources Sought Synopsis (SSS)Field Emission Scanning Electron MIcroscope (FESEM)

SUBJECT: Request for Quotation (RFQ) 80TECH24Q0005 for High Resolution Field Emission Scanning Electron MicroscopeThis is a combined synopsis/solicitation for commercial products or commercial services prepared in accordance with the format in subpart 12.6, as supplemented with additional information included in this notice.

FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM) FOR NIST CNST NANOFAB USER FACILITY. Solicitation ID/Procurement Identifier: 1333ND23QNB680101 Ultimate Completion Date: Mon Nov 19 18:00:00 GMT 2029

N0016418Q0106 - FIELD EMISSION SCANNING ELECTRON MICROSCOPE WITH ACCESORIES - PSC 6640 - NAICS 334516Solicitation Issue Date: 16 APRIL 2018 - Solicitation Closing Date: 21 MAY 2018 - Time 2:00 PM ESTNaval Surface Warfare Center (NSWC) Crane has a requirement for the acquisition of a Field Emission Scanning Microscope (FE-SEM).