TECHNOLOGY LICENSING OPPORTUNITYIon Beam Profiler For laboratories and companies working with ion beams who are dissatisfied with the cost and complexity of current two-dimensional beam profilers, or the lack of relevant information about the ion beam.
FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE Solicitation ID/Procurement Identifier: NB6800002300593 Ultimate Completion Date: Sun Jan 20 18:00:00 GMT 2030
The BMF requires an Ion Beam Etch and Ion Beam Deposition (IBE/IBD) system in order to fabricate its next generation devices.
Ion Beam Sputter System Bid Number:- 1913 Available Date:- 04-May-2021 Opening Date:- 12-May-2021 09:35
As part of this work, BSA is potentially seeking to acquire a Dual Ion Beam Sputtering System (DIBS) for Ion Beam Sputter Deposition at the Center for Integrated Nanotechnologies (CINT) and Los Alamos National Laboratory (LANL). BSA invites you to participate in accordance with the RFI letter and all supporting attachments. This requirement has been posted on the SAM.gov website under solicitation RFI-419911.
Brookhaven Science Associates (BSA) is issuing a Request For Quote (RFQ) for an Ion Beam Figuring Station to BNL specifications. BSA invites you to participate in accordance with the RFQ letter and all supporting attachments. This requirement has been posted on the SAM.gov website under solicitation RFQ- 420394. The proposal due date is November 02, 2022 at 5:00 p.m. EDT.
The BMF requires an Ion Beam Sputtering (IBS) system in order to deposit low loss optical films for its next generation devices.
