MACHINING AND HEAT TREATING OF CHARPY SPECIMENS IDIQ MAC FOR THE MATERIAL MEASUREMENT LABORATORY LOCATED AT NIST IN BOULDER, CO. Solicitation ID/Procurement Identifier: 1333ND21QNB680422 Ultimate Completion Date: Mon Jan 09 18:00:00 GMT 2023
Spirko Organization: Maryland Aviation Administration Department: J06MAA - MAA-PURCHASING Location: MAA - MAA-PURCHASING Fiscal Year: 17 Type Code: Allow Electronic Quote: No Alternate Id: Required Date: Available Date : 04/26/2017 01:09:00 PMInfo Contact: Bid Type: OPEN Informal Bid Flag: No Purchase Method: Open Market Pre Bid Conference: PRE-BID MEETING: 7005 Aviation Blvd Glen Burnie, MD 21061 MAC Building/Purchasing & Materials Management
Addtional Terms: The university will provide a 300-dpi *.pdf file (produced using InDesign CC for MAC). We estimate that material supplied from CNU will be available between June 1, 2022 and July 15, 2022.
Addtional Terms: The university will provide a 300-dpi *.pdf file (produced using InDesign CC for MAC). We estimate the CNU provided material will be ready on Friday, October 14, 2022.
Major items of work for this project include the following: The Work includes, but is not limited to, the replacement of the roofing system and miscellaneous modifications to the existing building MidAmerican Center (MAC). Materials include single ply membrane roofing, roof insulation, and metal roof edge. Mechanical and Electrical equipment on roofs shall remain during roofing project.
Addtional Terms: The university will provide a 300-dpi *.pdf file (produced using InDesign CC for MAC). We estimate that material supplied from CNU will be available between December 1, 2021 and January 3, 2022.
These laboratories provide cutting-edge equipment such as super inkjet printers and Atomic Force Microscopes for precise and high-resolution detail in material research, fabrication, and characterization.Microscopy and Characterization Suite (MaCS): The MaCS is a state-of-the-art materials characterization laboratory that provides cross-cutting capabilities that help characterize a wide range of materials, including metals, semiconductors, ceramics
