Search results for: milling focused

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  • Device Milling Focused Ion Beam (FIB)

    Type : Bid Notification

    Due : 11 Feb, 2023 (14 months ago)
    Posted : 15 months ago
    Started : 12 Jan, 2023 (15 months ago)

    The National Renewable Energy Laboratory (NREL) in Golden, CO seeks a readily available and demonstrable plasma focused ion beam, scanning electron microscope, and femtosecond laser where all three beams have coincident alignment on the sample for cross-sectioning devices at the millimeter length scale, 3D volume imaging, FIB polishing, and nanoscale imaging with 3D EDS and 3D EBSD mapping, as well as related accessories.

    From: Federal Government (Federal)

  • Lease-to-Own: Scanning Electron Microscope with Focused Ion Beam Milling

    Type : Bid Notification

    Due : 20 Jan, 2022 (about 2 years ago)
    Posted : about 2 years ago
    Started : 05 Jan, 2022 (about 2 years ago)

    Id: 2184 NAICS: 334516: Analytical Laboratory Instrument Manufacturing Posting Type: Sources Sought Posting Title: Lease-to-Own: Scanning Electron Microscope with Focused Ion Beam Milling Posted: 05-Jan-2022 Posting Close: 20-Jan-2022 16:29 Competition Type: Competitive

    From: Sandia National Laboratories (Federal)

  • Development of Novel Miniature Reserve Batteries on the Chip

    Type : Bid Notification

    Due : 20 May, 2021 (about 2 years ago)
    Posted : about 3 years ago
    Started : 17 May, 2021 (about 2 years ago)

    Tuller, "Direct Probing of Nano-dimensioned Oxide Multilayers with Aid of Focused Ion Beam Milling" Advanced Materials, 23 4543-4548, 2011. A. Chroneos, B. Yildiz, A. Tarancón, D. Parfitt and J. A. Kilner, "Oxygen Diffusion in Solid Oxide Fuel Cell Cathode and Electrolyte Materials: Mechanistic Insights from Atomistic Simulations" Energy and Environmental Science 4 2274-2789, 2011.

    From: Federal Government (Federal)