Search results for: milling focused ion

Refine your Search
Apply several filters to get precise search results
Showing opportunity 1 - 6 of 6
  • Device Milling Focused Ion Beam (FIB)

    Type : Bid Notification

    Due : 11 Feb, 2023 (14 months ago)
    Posted : 15 months ago
    Started : 12 Jan, 2023 (15 months ago)

    The National Renewable Energy Laboratory (NREL) in Golden, CO seeks a readily available and demonstrable plasma focused ion beam, scanning electron microscope, and femtosecond laser where all three beams have coincident alignment on the sample for cross-sectioning devices at the millimeter length scale, 3D volume imaging, FIB polishing, and nanoscale imaging with 3D EDS and 3D EBSD mapping, as well as related accessories.

    From: Federal Government (Federal)

  • Lease-to-Own: Scanning Electron Microscope with Focused Ion Beam Milling

    Type : Bid Notification

    Due : 20 Jan, 2022 (about 2 years ago)
    Posted : about 2 years ago
    Started : 05 Jan, 2022 (about 2 years ago)

    Id: 2184 NAICS: 334516: Analytical Laboratory Instrument Manufacturing Posting Type: Sources Sought Posting Title: Lease-to-Own: Scanning Electron Microscope with Focused Ion Beam Milling Posted: 05-Jan-2022 Posting Close: 20-Jan-2022 16:29 Competition Type: Competitive

    From: Sandia National Laboratories (Federal)

  • Pressurized Ion Chamber

    Type : Award

    Due : 31 May, 2023 (11 months ago)
    Posted : 11 months ago
    Started : 17 May, 2023 (11 months ago)

    Notice of Award to LUDLUM MEASUREMENTS INC

    From: Federal Government (Federal)