Search results for: milling focused ion beam

Refine your Search
Apply several filters to get precise search results
Showing opportunity 1 - 8 of 8
  • Device Milling Focused Ion Beam (FIB)

    Type : Bid Notification

    Due : 11 Feb, 2023 (14 months ago)
    Posted : 15 months ago
    Started : 12 Jan, 2023 (15 months ago)

    The National Renewable Energy Laboratory (NREL) in Golden, CO seeks a readily available and demonstrable plasma focused ion beam, scanning electron microscope, and femtosecond laser where all three beams have coincident alignment on the sample for cross-sectioning devices at the millimeter length scale, 3D volume imaging, FIB polishing, and nanoscale imaging with 3D EDS and 3D EBSD mapping, as well as related accessories.

    From: Federal Government (Federal)

  • Lease-to-Own: Scanning Electron Microscope with Focused Ion Beam Milling

    Type : Bid Notification

    Due : 20 Jan, 2022 (about 2 years ago)
    Posted : about 2 years ago
    Started : 05 Jan, 2022 (about 2 years ago)

    Id: 2184 NAICS: 334516: Analytical Laboratory Instrument Manufacturing Posting Type: Sources Sought Posting Title: Lease-to-Own: Scanning Electron Microscope with Focused Ion Beam Milling Posted: 05-Jan-2022 Posting Close: 20-Jan-2022 16:29 Competition Type: Competitive

    From: Sandia National Laboratories (Federal)

  • Request for Proposal (RFP) Dual Ion Beam Sputtering (DIBS) System

    Type : Bid Notification

    Due : 28 Jun, 2023 (10 months ago)
    Posted : 11 months ago
    Started : 14 Jun, 2023 (10 months ago)

    The dual ion beam sputtering system will be procured by Brookhaven Science Associates (BSA) on behalf of the CINT as part of the Nanoscale Science Research Center Recapitalization (NSRC-Recap) project.

    From: Federal Government (Federal)

  • Suite of Focused Ion Beam and Scanning Electron Microscope Instruments

    Type : Award

    Due : 30 Sep, 2023 (7 months ago)
    Posted : 11 months ago
    Started : 15 Sep, 2023 (7 months ago)

    Award notice as required by FAR 5.3.

    From: Federal Government (Federal)

  • Focused Ion Beam Scanning Electron Microscopes

    Type : Award

    Due : 27 Sep, 2023 (7 months ago)
    Posted : 7 months ago
    Started : 12 Sep, 2023 (7 months ago)

    Description: Focused Ion Beam Scanning Electron Microscopes

    From: Federal Government (Federal)