Id: 2399 NAICS: 334516: Analytical Laboratory Instrument Manufacturing Posting Type: RFQ Posting Title: probing system for flexible-environment investigation of electronic devices Posted: 06-Jun-2022 Posting Close: 09-Jun-2022 15:42 Competition Type: Small Business First
Added:Mar 20, 2019 3:39 pm See attachments
The Product Service Code (PSC) is 6640, Laboratory Equipment and Supplies.The nanometer probing system shall be compatible with:Equipment Name and Qty:FEI Helios NanoLab 660 - 1FEI Nova NanoSEM 650 - 1The following are the requirements:The Nanometer Probing System shall include:1. Tip Contact Detection2. Probe Capacity3. Probe Drift4. Probe Positioning5. Software6. Failure Analysis Capabilities7. Compatibility8. Substage9. Protective Case10.
See Attached Redacted J&A.
Contact Information: Julieta Barrera-Garcia, Email julieta.barrera-garcia@dmea.osd.mil Office Address :4234 54th Street McClellan CA 95652 Location: Defense Microelectronics Activity Set Aside: Award Number: HQ072718P0036 Award Amount : $399,431.00 Award Date: 081518 Awardee: ANGSTROM SCIENTIFIC INC.
The 4-axis drive allows the use of a fully integrated 4th-axis Haas rotary table or indexer for multi-sided machiningItem 5 RequirementWIPS-RWireless Intuitive Probing System (WIPS)Allows the ability to define work offset coordinates, set tool length offsets, and perform in-process inspection within the program, for both part inspection and tool breakage detection.Item 6 RequirementHSMHigh-Speed Machining allows faster feedrates, more complex toolpaths
Power-Failure Detection • Ethernet Interface • Remote Monitoring • Spare M-codes • Rigid Tapping • 1-year warranty • WIFI Connection • Window Air Blast • Visual Part Programming • User defined Macros • Spindle Orientation • Coordinate Rotation and Scaling • 30+ Side mount tool changer • 4th axis wiring and drive • Wireless intuitive probing system (work and spindle probe) • Chip auger • Automatic air gun • Programmable coolant nozzle • High speed
