Search results for: tem

Showing opportunity 1 - 10 of 82
  • Technical Exchange Meeting 12 - (TEM 12)

    Type : Bid Notification

    Due : 24 May, 2024 (in 24 days)
    Posted : 2 months ago
    Started : 29 Apr, 2024 (Yesterday)

    TEM 12 will build upon previous TEMs with increased technical discussion, operational feedback, targeted prototyping contract opportunities, and strategic government/industry sessions.

    From: Federal Government (Federal)

  • FULL-SERVICE AGREEMENT ON <b>TEM</b> TECNAI MICROSCOPE

    FULL-SERVICE AGREEMENT ON TEM TECNAI MICROSCOPE

    Type : Contract

    Due : 31 Mar, 2025 (in 11 months)
    Posted : 1 month ago
    Started : 01 Apr, 2024 (29 days ago)

    FULL-SERVICE AGREEMENT ON TEM TECNAI MICROSCOPE Solicitation ID/Procurement Identifier: 75N93024P00483 Ultimate Completion Date: Mon Mar 31 17:00:00 GMT 2025

    From: Federal Procurement Data System (Federal)

  • OUSD(R&E) Mission Capabilities (MC) Office Industry Engagement

    Type : Bid Notification

    Due : 14 May, 2024 (in 14 days)
    Posted : 24 days ago
    Started : 05 Apr, 2024 (24 days ago)

    This TEM will help describe the future operating environment and technical challenges, while providing participants a better understanding of ASD(MC)’s efforts, vision, threats, technical priorities, capability challenges, and areas that need private sector support.

    From: Federal Government (Federal)

  • Army Network Capability Set 25 Technical Exchange Meeting 7

    Type : Bid Notification

    Due : 20 Dec, 2025 (in 19 months)
    Posted : about 2 years ago
    Started : 30 Nov, 2021 (about 2 years ago)

    The JCM TEM 7 Community is an area set up to contain information in support of the TEM 7 Event happening on 2 December 2021 in Nashville, TN. It is NOT the site to register for the actual TEM 7 Event. Everyone needing access to the JCM TEM 7 Community will need to request an account regardless of any prior JCM TEM access.

    From: Federal Government (Federal)

  • Spare parts of JEOL <b>TEM</b> JEM-2100

    Spare parts of JEOL TEM JEM-2100

    Type : Contract

    Due : 20 Mar, 2024 (1 month ago)
    Posted : 1 month ago
    Started : 06 Mar, 2024 (1 month ago)

    Industrial Research||IIP-Dehradun - CSIR||Purchase-IIP - CSIRTender Reference NumberIIP/PUR/2/1516/JEOLTender ID 2024_CSIR_190158_1Withdrawal AllowedYesTender TypeSingleForm Of ContractSupplyTender CategoryGoodsNo. of Covers1General Technical Evaluation Allowed NoItemWise Technical Evaluation AllowedNoPayment ModeNot ApplicableIs Multi Currency Allowed For BOQNoIs Multi Currency Allowed For FeeNoAllow Two Stage BiddingNo -- TitleSpare parts of JEOL TEM

    From: Council of Scientific and Industrial Research (Federal)

  • Pro <b>Tem</b> Paintbooth & Associated Equipment for Watervliet Arsenal, Watervliet, New York

    Pro Tem Paintbooth & Associated Equipment for Watervliet Arsenal, Watervliet, New York

    Type : Award

    Due : 28 Mar, 2024 (1 month ago)
    Posted : 1 month ago
    Started : 13 Mar, 2024 (1 month ago)

    To provide all labor, materials, parts, and equipment for the installation of the new Pro Tem Paintbooth for Building 137 per Performance Work Statement Specification # 01-24-4940 dated 12/08/2023. Build out of additional breaker cabinet from existing materials – No ChargeService Contract Labor Standards 15-4143 REV. 26 applies and is incorporated.Contracting Officer Representative (COR): Justin Rowe

    From: Federal Government (Federal)

  • FY2024 Small Business Innovation Research (SBIR) Program for CHIPS for America – CHIPS Metrology

    Type : Bid Notification

    Due : 14 Jun, 2024 (in 1 month)
    Posted : 11 days ago
    Started : 03 Apr, 2024 (26 days ago)

    infrared (O-PTIR) microscope. 6: High brightness compact X-ray or EUV sources for semiconductor metrology 7: Nanoscale dimensional metrology reference standards to support semiconductor metrology 8: Advanced Electron Backscatter Diffraction (EBSD) detector offering high pixel density, high-speed and low noise operation, and low kV detection enabled by directly detecting electrons using an application specific integrated circuit (ASIC) detector 9: TEM

    From: Small Business Innovation Research (Federal)