FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPES

From: Federal Procurement Data System(Federal)
NB1000002300586

Basic Details

started - 15 Sep, 2023 (7 months ago)

Start Date

15 Sep, 2023 (7 months ago)
due - 16 Mar, 2030 (in about 5 years)

Due Date

16 Mar, 2030 (in about 5 years)
Contract

Type

Contract
NB1000002300586

Identifier

NB1000002300586
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

Customer / Agency

NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
unlockUnlock the best of InstantMarkets.

Please Sign In to see more out of InstantMarkets such as history, intelligent business alerts and many more.

Don't have an account yet? Create a free account now.

FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPES Solicitation ID/Procurement Identifier: NB1000002300586 Ultimate Completion Date: Sat Mar 16 17:00:00 GMT

5350, NORTH EAST DAWSON CREEK DRIVE,HILLSBORO,USALocation

Address: 5350, NORTH EAST DAWSON CREEK DRIVE,HILLSBORO,USA

Country : United StatesState : Oregon

You may also like

2023 SERVICE CONTRACT FOR TWO HITACHI S-4700 SCANNING ELECTRON MICROSCOPES

Due: 31 Jul, 2024 (in 3 months)Agency: NATIONAL AERONAUTICS AND SPACE ADMINISTRATION

JEOL ELECTRON MICROSCOPE PM BASE PLUS 4

Due: 28 Feb, 2029 (in about 4 years)Agency: VETERANS AFFAIRS, DEPARTMENT OF

JEOL SCANNING ELECTRON MICROSCOPE MAINTENANCE.

Due: 07 Dec, 2028 (in about 4 years)Agency: ATF ACQUISITION AND PROPERTY MGMT DIV

Please Sign In to see more like these.

Don't have an account yet? Create a free account now.

Classification

ANALYTICAL LABORATORY INSTRUMENT MANUFACTURING/334516