Cryogenic Electron Microscopy Focused Ion Beam Suite

NREL is seeking information from sources that may be capable of providing a commercial solution for the cryogenic electron microscopy FIB suite will be installed and operated within the Microscopy and Imaging Sciences group at NREL, in support of many projects and materials development across the entire laboratory. These tools will be operated by microscopy experts to support a growing base of qualified users on the tools. Samples vary from semiconductor devices, heterogenous devices, metals, polymers, electrodes, perovskites, and stacked combinations with and without