Procurement of a Variable Pressure Field Emission Scanning Electron Microscope System

(Expired)

From: Federal Government(Federal)

Go To Official Site

Basic Details	Start Date 04 Aug, 2022 (20 months ago) Due Date 14 Aug, 2022 (20 months ago) Type Bid Notification Identifier 1333ND22QNB730244
Customer / Agency	COMMERCE, DEPARTMENT OF (13387)NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (4470)DEPT OF COMMERCE NIST (4389)
Attachments (1)	CSS 1333ND22QNB730244_FINAL.pdf

Unlock the best of InstantMarkets.

Please Sign In to see more out of InstantMarkets such as history, intelligent business alerts and many more.

Don't have an account yet? Create a free account now.

Procurement of a Variable Pressure Field Emission Scanning Electron Microscope

Also Search For

Location

Place Of Performance : N/A

Country : United StatesState : MarylandCity : Gaithersburg

You may also like

JEOL SCANNING ELECTRON MICROSCOPE MAINTENANCE.

Due: 07 Dec, 2028 (in about 4 years)

Agency: ATF ACQUISITION AND PROPERTY MGMT DIV

MAINTENANCE SCANNING ELECTRON MICROSCOPE (QUANTA 650)

Due: 16 Jun, 2025 (in 13 months)

Agency: FEDERAL HIGHWAY ADMINISTRATION

FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPES

Due: 16 Mar, 2030 (in about 5 years)

Agency: NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

Please Sign In to see more like these.

Don't have an account yet? Create a free account now.

Classification

naicsCode 334516Analytical Laboratory Instrument Manufacturing

pscCode 6640Laboratory Equipment and Supplies