A--Nanoscale X-ray Tomosynthesis for Rapid Assessment of Integrated Circuit Dies (NeXT-RAID)

Dates

Award started - 13 Jun, 2017 (17 months ago) - A--Nanoscale X-ray Tomosynthesis for Rapid Assessment of Integrated Circuit Dies (NeXT-RAID)

Start Date

13 Jun, 2017 (17 months ago)
Award due - 13 Jun, 2017 (17 months ago) - A--Nanoscale X-ray Tomosynthesis for Rapid Assessment of Integrated Circuit Dies (NeXT-RAID)

Due Date

Award - A--Nanoscale X-ray Tomosynthesis for Rapid Assessment of Integrated Circuit Dies (NeXT-RAID)

Opportunity Type

Award
 - A--Nanoscale X-ray Tomosynthesis for Rapid Assessment of Integrated Circuit Dies (NeXT-RAID)

Opportunity Identifier

Award Department of the Air Force - A--Nanoscale X-ray Tomosynthesis for Rapid Assessment of Integrated Circuit Dies (NeXT-RAID)

Customer / Agency

Department of the Air Force
Award AFRL/RQK - WPAFB - A--Nanoscale X-ray Tomosynthesis for Rapid Assessment of Integrated Circuit Dies (NeXT-RAID)

Location

AFRL/RQK - WPAFB
From: Federal Government(Federal)
No Description Provided Contact Information: JESSICA M MORLOCK, Contracting Officer, Phone 937-713-9816 x, Email jessica.morlock@us.af.mil Office Address :USAF/AFMC, AFRL WRIGHT RESEARCH SITE, 2130 EIGHTH STREET, BUILDING 45, WRIGHT-PATTERSON AFB OH 45433-7541 Location: AFRL/RQK - WPAFB Set Aside: Award Number: FA865017C9113P00002 Award Amount : Award Date: 061317 Awardee: MASSACHUSETTS INSTITUTE OF TECHNOLOGY, MIT 77 MASSACHUSETTS AVE, CAMBRIDGE MA 02139-4301

Location

Country : United States